Knowra Beam techniques Beam techniques Beam techniques use directed streams of particles or waves to inspect, measure, modify, or treat a target. Their effects depend on the beam’s type, energy, focus, and interaction with matter.
Scanning electron microscopy : An imaging method that scans a focused electron beam across a specimen and detects emitted signals. It uses a focused electron beam to reveal surface structure at high resolution.
Particle accelerator : A device that increases the energy of charged particles and directs them into beams. Accelerators supply energetic particle beams for research, industry, and treatment.
Charged particle : A particle with a nonzero electric charge that responds to electromagnetic fields. Electrons and ions are charged particles that can be steered into beams.
Photon beam : A directed stream of photons, commonly visible light, X-rays, or gamma rays. Photon beams differ from material-particle beams in charge, mass, and interaction patterns.
Focused ion beam : A technique that directs ions onto a small region to image, mill, or deposit material. It shows how a beam can remove or add material with micrometre-scale precision.
Electron gun : A device that emits and shapes a stream of electrons, usually by thermionic or field emission. It creates the electron stream used in many beam instruments.
Electromagnetic radiation : Energy propagated through space as oscillating electric and magnetic fields. Light, X-rays, and radio waves are electromagnetic beams.
Ion beam : A directed stream of electrically charged atoms or molecules. Ion beams can transfer momentum and remove material more directly than light beams.
Electron-beam lithography : A patterning method that uses a focused electron beam to expose an electron-sensitive resist. It uses beam position and dose to create nanoscale patterns.
Magnetic lens : A magnetic field arrangement that focuses or deflects charged-particle beams. Magnetic lenses control the path and focus of electron and ion beams.
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