Surface analysis (materials science)

Surface analysis examines a material’s outermost layers to determine their composition, structure, and physical or chemical properties. It uses techniques whose signals are sensitive to the surface or near-surface region.

X-ray photoelectron spectroscopy: A surface-sensitive spectroscopy that identifies elements and chemical states by measuring photoelectrons emitted under X-ray irradiation. Its electron escape depth makes it a standard method for identifying surface composition and bonding.
Inelastic mean free path: The average distance a particle travels in a material before losing energy through an inelastic interaction. It helps set how deeply emitted electrons can escape and still carry useful surface information.
Thin-film characterization: The measurement of a thin film’s composition, thickness, structure, and properties. Surface techniques distinguish a film’s exposed surface from its interface and substrate.
Bulk analysis: The measurement of a material’s average composition or properties across a substantial volume. It averages interior material, whereas surface analysis targets a shallow region.
Surface reconstruction: A rearrangement of atoms at a crystal surface that changes its periodic structure from the bulk termination. Measured surface structure may differ from the structure inferred from the underlying crystal.
Auger electron spectroscopy: A surface analysis technique that identifies elements by measuring characteristic Auger electrons emitted after inner-shell ionization. It provides elemental maps with high spatial resolution and sensitivity to the outermost layers.
Surface sensitivity: The degree to which a measurement signal originates from a material’s surface rather than its bulk. It explains why the same material can yield different results with different probing depths.
Corrosion science: The study of material degradation through chemical or electrochemical reactions with surrounding environments. Surface analysis identifies corrosion products and tracks changes in protective layers.
Energy-dispersive X-ray spectroscopy: An elemental analysis method that identifies elements from characteristic X-rays generated by electron-beam interactions. Its typical interaction volume is much deeper than the surface-sensitive electron methods.
Adsorption: The accumulation of atoms, molecules, or ions at the surface of a solid or liquid. Adsorbed species can be either the target of analysis or an unwanted source of signal.

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Kai SiegbahnNarrower topic: ESCA made detailed chemical analysis of solid surfaces widely practical.