Linked from

The 14 pages that link to Scanning electron microscopy, each with the reason it gives.

• Atomic force microscopyCompared with: It images with electrons rather than a mechanically interacting surface probe.

• Scanning probe microscopyCompared with: It also scans point by point, but uses an electron beam instead of a physical tip.

• Gerd BinnigCompared with: Its beam-and-detector approach differs from the local probe used in Binnig’s instrument.

• Scherrer equationCompared with: Its particle images measure visible morphology, not necessarily coherent crystallite size.