Linked from

The 13 pages that link to Scanning probe microscopy, each with the reason it gives.

• MicroscopyBroader topic: Its probe traces surface properties rather than forming an image through light or electrons.

• MicroscopeCompared with: Unlike imaging through lenses, it traces surface properties with a probe.

• Carbon nanotubeRelated: Nanotubes have been used as narrow probes for imaging fine surface features.

• Atomic force microscopyNarrower topic: AFM is one member of this probe-based imaging family.

• Scanning tunneling microscopeNarrower topic: The scanning tunneling microscope is a member of this broader instrument family.

• Piezoelectric actuatorRelated: Piezo stages position probes with nanometer-scale motion while scanning a surface.

• Gerd BinnigNarrower topic: Binnig’s tunneling microscope founded a family of methods for nanoscale imaging.

• Heinrich RohrerNarrower topic: Rohrer’s instrument helped establish this broader family of surface-imaging techniques.

• Optical microscopeCompared with: It measures surface properties through probe interactions rather than transmitted or reflected light.

• Surface analysis (materials science)Narrower topic: It reveals surface topography and local properties through probe–surface interactions.

• Electron techniquesCompared with: It can measure surface properties without relying on an electron beam.

• Nanoelectromechanical systemsNarrower topic: NEMS sensors share the tiny probes and force-sensitive mechanics used in this imaging family.

• Timeline of microscope technologyBroader topic: It introduced surface imaging at atomic scales without relying on conventional lenses.